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High-Speed Pattern Generator and GaAs Pin : Electronics for a Gigahertz Production Test System.

Dean J. KratzerSteve BartonFrancois J. HenleyDavid A. Plomgrem
Published in: ITC (1988)
Keyphrases
  • pattern generator
  • high speed
  • low power
  • production system
  • production process
  • spatio temporal
  • statistical tests
  • markov random field
  • test cases