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Novel properties of light transmission in multilayer stacks of air/silver thin films.

Arturo Robledo-MartinezJuan Carlos SandovalP. Pereyra
Published in: Microelectron. J. (2009)
Keyphrases
  • thin film
  • white light interferometry
  • silicon nitride
  • grain size
  • multi layer
  • data transmission
  • film thickness
  • database
  • viewpoint
  • wireless sensor networks
  • high density