A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips.

Hong-Dar Lin Chung-Yu Chung

Published in: ISNN (2) (2007)

Keyphrases

defect detection
neural network
neural network is trained
three dimensional
feature vectors
vector field
textured surfaces
wavelet transform
feature selection
image processing
multiscale
artificial neural networks
high density