A Test Architecture for Machine Learning Product.
Yasuharu NishiSatoshi MasudaHideto OgawaKeiji UetsukiPublished in: ICST Workshops (2018)
Keyphrases
- machine learning
- pattern recognition
- machine learning algorithms
- data mining
- life cycle
- management system
- explanation based learning
- knowledge engineering
- learning algorithm
- reinforcement learning
- inductive learning
- real time
- machine learning methods
- decision trees
- hardware architecture
- test data
- learning systems
- text classification
- computational intelligence
- natural language processing
- active learning
- data analysis
- feature selection
- supply chain
- artificial intelligence
- test cases
- support vector machine
- knowledge discovery
- natural language
- computer vision
- layered architecture