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REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations.

Charles LamechJim AarestadJim PlusquellicReza M. RadKanak Agarwal
Published in: ICCAD (2011)
Keyphrases
  • high speed
  • low cost
  • embedded systems
  • phase locked loop
  • neural network
  • destination node
  • complex structures
  • measurement noise
  • analog vlsi
  • built in self test