Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules.

Eunjeong Choi Jeongtae Kim

Published in: IEEE Access (2023)

Keyphrases

integrated circuit
image noise
edge detection
image data
input image
single image
multiscale
image transformations
image retrieval
image features
image analysis
image classification
feature points
image segmentation
partial occlusion
segmentation method
high resolution
polar coordinates
pixel values
image compression
image processing algorithms
real time
geometric distortions
discrete fourier transform
printed circuit boards
functional modules
electron beam