A Comparison of Environmental Stressing Data and Simulation at the Corner of a Test Chip in a FC-BGA Package.
Sandeep MallampatiZaeem BaigScott PozderEng Chye ChuaPublished in: IRPS (2019)
Keyphrases
- data sets
- training data
- data collection
- synthetic data
- data structure
- data analysis
- image data
- data distribution
- prior knowledge
- data sources
- end users
- low cost
- test data
- real time
- statistical significance
- high density
- measured data
- computer systems
- input data
- high speed
- small number
- probability distribution
- high quality