A Microscopic Multi-view Based Workeell for Wafer-level Microassembling.

Minglei Sun Jingjun Yu Guanghua Zong Shusheng Bi Rong Liu

Published in: ROBIO (2006)

Keyphrases

levels of abstraction
data mining
multi agent
pattern recognition
higher level
data sets
neural network
real world
genetic algorithm
learning algorithm
artificial intelligence
decision trees
semiconductor manufacturing