Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly.
Michael OpitzGeorg WaltnerHorst PosseggerHorst BischofPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (2020)
Keyphrases
- metric learning
- dimensionality reduction
- distance metric
- distance metric learning
- semi supervised
- pairwise
- machine learning and pattern recognition
- multi task
- learning tasks
- feature space
- distance function
- manifold learning
- mahalanobis metric
- learning algorithm
- vector space
- high dimensional data
- euclidean distance
- pattern recognition
- feature selection
- background knowledge
- semi supervised learning
- unsupervised learning
- distance measure
- domain knowledge
- similarity measure