A Bayesian framework for multilead SMD post-placement quality inspection.
Michael E. ZervakisStefanos GoumasGeorge A. RovithakisPublished in: IEEE Trans. Syst. Man Cybern. Part B (2004)
Keyphrases
- bayesian framework
- prior knowledge
- gaussian process
- hyperparameters
- generative model
- posterior probability
- bayesian formulation
- quality control
- probability density function
- posterior distribution
- maximum a posteriori
- bayesian model
- high quality
- prior distribution
- three dimensional
- decision trees
- step size
- expectation maximization
- higher order