Failure Factor Based Yield Enhancement for SRAM Designs.

Yu-Tsao Hsing Chih-Wea Wang Ching-Wei Wu Chih-Tsun Huang Cheng-Wen Wu

Published in: DFT (2004)

Keyphrases

factor analysis
power consumption
information systems
image processing
image enhancement
data transmission
data mining
failure modes
computer vision
clustering algorithm
search algorithm
power reduction
data sets
failure rate
low cost
information retrieval
neural network