Login / Signup
A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters.
Hsin-Wen Ting
Bin-Da Liu
Soon-Jyh Chang
Published in:
Asian Test Symposium (2004)
Keyphrases
</>
circuit design
frequency domain
vlsi architecture
data conversion
printed circuit
built in self test
cmos image sensor
delta sigma
real time
machine learning
multi agent
signal processing
digital curves
analog vlsi