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Characterization in Submicron CMOS.

Antoni FerréJoan Figueras
Published in: ITC (1997)
Keyphrases
  • vlsi circuits
  • low power
  • high speed
  • mixed signal
  • low cost
  • power consumption
  • analog vlsi
  • genetic algorithm
  • artificial intelligence
  • electron beam
  • axiomatic characterization
  • data sets
  • single chip