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Electrical characteristics and modelling of multi-island single-electron transistor using SIMON simulator.
A. Boubaker
M. Troudi
Nabil Sghaier
A. Souifi
Nicolas Baboux
A. Kalboussi
Published in:
Microelectron. J. (2009)
Keyphrases
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high speed
real time
test bed
physical characteristics
low voltage
data sets
databases
neural network