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A soft error robust 32kb SRAM macro featuring access transistor-less 8T cell in 65-nm.

Jaspal Singh ShahDavid NairnManoj Sachdev
Published in: VLSI-SoC (2012)
Keyphrases
  • leakage current
  • knowledge base
  • low power
  • access control
  • estimation error
  • database
  • real time
  • video sequences
  • error bounds
  • partial occlusion
  • data transmission