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Flash Memory Testing and Built-In Self-Diagnosis With March-Like Test Algorithms.
Jen-Chieh Yeh
Kuo-Liang Cheng
Yung-Fa Chou
Cheng-Wen Wu
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
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software testing
flash memory
data sets
artificial intelligence
similarity search
solid state