Login / Signup

A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting.

Luís RolíndezSalvador MirAhcène BounceurJean-Louis Carbonéro
Published in: J. Electron. Test. (2006)
Keyphrases
  • information systems
  • case study
  • model fitting
  • real time
  • data sets
  • artificial intelligence
  • multiscale
  • parameter estimation
  • software testing
  • detection scheme
  • fitting method