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Influence of metallic tubes on the reliability of CNTFET SRAMs: error mechanisms and countermeasures.
Zhen Wang
Mark G. Karpovsky
Ajay Joshi
Published in:
ACM Great Lakes Symposium on VLSI (2011)
Keyphrases
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countermeasures
information security
defense mechanisms
error detection
failure rate
power analysis
error rate
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data mining
information systems
information technology
intrusion detection
rural areas
security measures
security breaches