Design for Hierarchical Two-Pattern Testability of Data Paths.
Md. Altaf-Ul-AminSatoshi OhtakeHideo FujiwaraPublished in: Asian Test Symposium (2001)
Keyphrases
- data points
- data sets
- data analysis
- raw data
- data collection
- data processing
- database
- image data
- end users
- statistical analysis
- missing data
- probability distribution
- data sources
- prior knowledge
- data distribution
- training data
- association rule mining
- noisy data
- data integrity
- computer systems
- input data
- knowledge discovery
- xml documents
- data structure
- case study
- neural network