Hierarchical Clustering Driven Test Case Selection in Digital Circuits.
Conor RyanMeghana KshirsagarKrishn Kumar GuptLukas RosenbauerJoseph P. SullivanPublished in: ICSOFT (2021)
Keyphrases
- hierarchical clustering
- digital circuits
- test case selection
- test cases
- clustering method
- data flow
- model based diagnosis
- finite state machines
- incremental clustering
- k means
- agglomerative hierarchical clustering
- clustering algorithm
- single link
- hierarchical clustering algorithm
- text clustering
- circuit design
- correlation clustering
- partitional clustering
- functional decomposition
- nearest neighbor
- data structure