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Reliability analysis of Junction-less Double Gate (JLDG) MOSFET for analog/RF circuits for high linearity applications.
Abhinav Gupta
Sanjeev Rai
Published in:
Microelectron. J. (2017)
Keyphrases
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reliability analysis
analog vlsi
analog circuits
circuit design
radio frequency
fault tree
digital circuits
cmos technology
relevance feedback
high speed
neural network
management system
floating gate