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ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric.

Mustafa Munawar ShihabBharath RamanidharanSuraag Sunil TellakulaGaurav Rajavendra ReddyJingxiang TianCarl SechenYiorgos Makris
Published in: VTS (2020)
Keyphrases
  • low cost
  • levels of abstraction
  • application specific
  • website
  • web services
  • feature extraction
  • expert systems
  • relational databases
  • mobile robot
  • object oriented
  • test data
  • application level