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ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric.
Mustafa Munawar Shihab
Bharath Ramanidharan
Suraag Sunil Tellakula
Gaurav Rajavendra Reddy
Jingxiang Tian
Carl Sechen
Yiorgos Makris
Published in:
VTS (2020)
Keyphrases
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low cost
levels of abstraction
application specific
website
web services
feature extraction
expert systems
relational databases
mobile robot
object oriented
test data
application level