Process control using VSI cause selecting control charts.
Su-Fen YangPublished in: J. Intell. Manuf. (2010)
Keyphrases
- process control
- control charts
- statistical process control
- control system
- abnormal patterns
- adaptive sampling
- product quality
- weighted moving average
- manufacturing process
- selection algorithm
- semiconductor manufacturing
- intelligent control
- cumulative sum
- learning algorithm
- adaptive control
- control method
- parallel algorithm
- software systems
- multi modal
- graduate education
- reinforcement learning