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Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis.
Shiho Hagiwara
Takanori Date
Kazuya Masu
Takashi Sato
Published in:
IEICE Trans. Electron. (2014)
Keyphrases
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high dimension
sample size
computer vision
feature selection
pattern recognition
nearest neighbor
high dimensional data
image processing
high dimensional
fault diagnosis
small sample