degradation of p-GaN AlGaN/GaN HEMTs on SiC substrates.

Manqing Hu Gengxin Liu E. Du Feiyan Mu

Published in: IEICE Electron. Express (2020)

Keyphrases

structuring elements
high density
machine learning
database systems
pattern recognition
viewpoint
image analysis
multiresolution
prior knowledge
high resolution
small number
least squares
gray scale
binary images