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High stability current supply design for atomic resolution electron microscopy.

Maryam M. MotamediMichael S. Isaacson
Published in: IEICE Electron. Express (2012)
Keyphrases
  • electron microscopy
  • design process
  • x ray
  • building blocks
  • data sets
  • neural network
  • wide range
  • knowledge based systems
  • low energy
  • case study
  • user interface
  • current status
  • image stacks