A new built-in TPG method for circuits with random patternresistant faults.
Xrysovalantis KavousianosDimitris BakalisDimitris NikolosSpyros TragoudasPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
- significant improvement
- fully automatic
- high accuracy
- evaluation method
- preprocessing
- classification method
- segmentation method
- detection method
- error rate
- synthetic data
- image quality
- classification accuracy
- high precision
- computational cost
- cost function
- theoretical analysis
- optimization algorithm
- detection algorithm
- clustering method