Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices.
Timothy J. DysartPeter M. KoggePublished in: IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
- cellular automata
- power dissipation
- cmos technology
- random access memory
- bayesian networks
- probabilistic model
- singular value decomposition
- digital circuits
- knowledge transfer
- magnetic field
- high speed
- generative model
- power consumption
- posterior probability
- solid state
- failure rate
- probabilistic logic
- uncertain data
- real time
- covariance matrix
- transfer learning
- data sets