Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment.
Jose MoreiraHeidi BarnesHiroshi KagaMichael ComaiBernhard RothMorgan CulverPublished in: ITC (2008)
Keyphrases
- real world
- promising directions
- key issues
- fully automated
- input output
- lessons learned
- paradigm shift
- semi automated
- long term
- database
- statistical significance
- coming years
- learning algorithm
- open issues
- automated analysis
- interface design
- technical challenges
- response time
- statistical tests
- data model
- computer assisted
- test cases
- multi dimensional