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Deep Learning for Semiconductor Defect Classification.
Terence Sweeney
Sonya Coleman
Dermot Kerr
Published in:
INDIN (2022)
Keyphrases
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deep learning
defect classification
unsupervised learning
unsupervised feature learning
machine learning
weakly supervised
mental models
deep architectures
deep belief networks
bayesian networks
reinforcement learning
supervised learning
decision support