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A digital delay line with coarse/fine tuning through gate/body biasing in 28nm FDSOI.
Ilias Sourikopoulos
Antoine Frappé
Andreia Cathelin
Laurent Clavier
Andreas Kaiser
Published in:
ESSCIRC (2016)
Keyphrases
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fine tuning
fine tuned
metal oxide semiconductor
viable alternative
fine tune
cmos technology
human body
coarse to fine
high speed
action selection
low cost
circuit design
leakage current
metadata
multiple input
nm technology
data sets
integrated circuit
markov chain
multiresolution
image sequences
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