Scaling trends and challenges of advanced memory technology.
Seok-Hee LeePublished in: VLSI-DAT (2014)
Keyphrases
- future trends
- technical solutions
- lessons learned
- case study
- memory requirements
- paradigm shift
- open issues
- technical aspects
- data processing
- cost effective
- radio frequency identification rfid
- innovative solutions
- key findings
- rapid development
- technical issues
- technological advances
- key technologies
- neural network
- memory size
- memory usage
- emerging trends
- advanced technologies
- memory space
- coming years
- practical experiences
- computing power