Segmentation of Integrated Circuit Layouts from Scan Electron Microscopy Images.

Bruno Machado Trindade Eranga Ukwatta Mike Spence Chris Pawlowicz

Published in: CCECE (2018)

Keyphrases

microscopy images
integrated circuit
electron microscopy
electron beam
microscopic images
multi channel
confocal images
cell division
phase contrast
cancer cells
x ray
cell nuclei
phase contrast images
nonrigid registration
image processing
thin film
segmentation algorithm
markov random field
three dimensional