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16.4 High-Density and Low-Power PUF Designs in 5nm Achieving 23× and 39× BER Reduction After Unstable Bit Detection and Masking.

Sudhir S. KudvaMahmut Ersin SinangilStephen G. TellNikola NedovicSanquan SongBrian ZimmerC. Thomas Gray
Published in: ISSCC (2024)
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