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Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms.

Daniel G. SaabYoussef SaabJacob A. Abraham
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
  • vlsi circuits
  • genetic algorithm
  • semi automatic
  • machine vision
  • pattern recognition
  • feature vectors
  • image analysis
  • computer vision and image processing