Login / Signup
Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms.
Daniel G. Saab
Youssef Saab
Jacob A. Abraham
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
</>
vlsi circuits
genetic algorithm
semi automatic
machine vision
pattern recognition
feature vectors
image analysis
computer vision and image processing