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Scaling of InAlN/GaN power transistors.

Daniel PiedraHyung-Seok LeeTomás PalaciosXiang GaoShiping Guo
Published in: ESSDERC (2012)
Keyphrases
  • power consumption
  • high power
  • low power
  • integrated circuit
  • databases
  • efficient implementation
  • high density
  • real world
  • pattern recognition
  • expert systems