A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC.

Sergey G. Mosin

Published in: Inf. Technol. Control. (2011)

Keyphrases

mixed signal
built in self test
integrated circuit
low power
multi channel
vlsi circuits
digital circuits
low cost
power consumption
cmos technology
high speed
circuit design
manufacturing systems
random access
low voltage
computer systems
pattern matching
query language
digital signal processing