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A Methodology for Worst-Case Analysis of Integrated Circuits.
Sani R. Nassif
Andrzej J. Strojwas
Stephen W. Director
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1986)
Keyphrases
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integrated circuit
worst case analysis
average case
worst case
np hardness
greedy heuristic
printed circuit boards
electron beam
lower bound
search space
upper bound
sample size
multistage
uniform distribution
linear programming relaxation