Login / Signup
Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD.
Pin Su
Samel K. H. Fung
Weidong Liu
Chenming Hu
Published in:
ISQED (2002)
Keyphrases
</>
dynamic behaviors
cmos technology
silicon on insulator
low power
high speed
low cost
real time
power consumption
architectural model
software engineering
behavioral models
nm technology
information technology
domain knowledge