A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy.
Dirk Van DyckMarc Op de BeeckD. TangJ. JansenH. W. ZandbergenPublished in: ICIP (1) (1996)
Keyphrases
- high resolution
- electron microscopy
- low energy
- low resolution
- super resolution
- transmission electron microscopy
- x ray
- remote sensing
- field of view
- image stacks
- high resolution images
- magnetic resonance images
- high quality
- image reconstruction
- image super resolution
- thin film
- high frequency
- low resolution images
- spatial resolution
- neural network
- reconstruction method
- higher resolution
- wireless sensor networks
- depth map
- super resolution reconstruction
- database systems
- three dimensional