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A new charge pump circuit dealing with gate-oxide reliability issue in low-voltage processes.
Ming-Dou Ker
Shih-Lun Chen
Chia-Sheng Tsai
Published in:
ISCAS (1) (2004)
Keyphrases
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low voltage
leakage current
cmos technology
design considerations
power line
low power
power consumption
power management
computer vision
video sequences
low cost
high speed
power dissipation