A Large "Read" and "Write" Margins, Low Leakage Power, Six-Transistor 90-nm CMOS SRAM.
Tadayoshi EnomotoNobuaki KobayashiPublished in: IEICE Trans. Electron. (2011)
Keyphrases
- leakage current
- low voltage
- power consumption
- low power
- power management
- power dissipation
- cmos technology
- nm technology
- power line
- read write
- disk drives
- random access memory
- power reduction
- power saving
- metal oxide semiconductor
- high speed
- electrical properties
- design considerations
- energy saving
- neural network
- ultra low power
- power system
- low cost