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Frequency domain analysis of robust demodulators for high-speed atomic force microscopy.

Michael G. RuppertDavid M. HarcombeMichael R. P. RagazzonS. O. Reza MoheimaniAndrew J. Fleming
Published in: ACC (2017)
Keyphrases
  • high speed
  • frequency domain analysis
  • atomic force microscopy
  • real time
  • computationally efficient
  • low pass filtering
  • image processing
  • motion estimation