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On Efficient LHS-Based Yield Analysis of Analog Circuits.

Javid JaffariMohab Anis
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • analog circuits
  • fault diagnosis
  • data analysis
  • database
  • real time
  • neural network
  • website
  • pattern recognition
  • statistical analysis
  • complexity analysis