Manufacturing evaluation system based on AHP/ANP approach for wafer fabricating industry.
Chang-Lin YangShan-Ping ChuangRong-Hwa HuangPublished in: Expert Syst. Appl. (2009)
Keyphrases
- integrated circuit
- evaluation method
- evaluation model
- semiconductor manufacturing
- evaluation methods
- ahp method
- decision making
- analytic hierarchy process
- wafer fabrication
- quality control
- massively parallel
- process improvement
- logistics industry
- database
- multi criteria
- raw material
- information technology
- artificial intelligence