A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution.
Hiroshi YamazakiMotohiro WakazonoToshinori HosokawaMasayoshi YoshimuraPublished in: IEICE Trans. Inf. Syst. (2013)
Keyphrases
- test data
- pairwise
- long term
- significant improvement
- dynamic programming
- experimental evaluation
- segmentation method
- high precision
- computationally efficient
- input data
- computational cost
- cost function
- preprocessing
- computational complexity
- density function
- statistical significance
- identification rate
- classification accuracy
- health care
- clustering method
- optimization algorithm
- data sets
- similarity measure
- neural network