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Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under high temperature storage tests.

Yasunori TatenoYasuyo KurachiHiroshi YamamotoTakashi Nakabayashi
Published in: IRPS (2018)
Keyphrases
  • high temperature
  • data storage
  • storage and retrieval
  • computational model
  • storage space
  • databases
  • case study
  • multiscale
  • test cases
  • learning mechanism
  • storage devices
  • processing capabilities