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Analysis and Background Self-Calibration of Comparator Offset in Loop-Unrolled SAR ADCs.

Shaolong LiuTaimur Gibran RabuskeJeyanandh ParameshLawrence T. PileggiJorge R. Fernandes
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
  • neural network
  • image analysis
  • data mining
  • machine learning
  • three dimensional
  • image sequences
  • infrared
  • fourier transform