Login / Signup
A Few-Shot Learning Method Using Feature Reparameterization and Dual-Distance Metric Learning for Object Re-Identification.
Sheng-Hung Fan
Min-Hong Lin
Jung-Yi Jiang
Yau-Hwang Kuo
Published in:
IEEE Access (2021)
Keyphrases
</>
distance metric learning
distance metric
component analysis
preprocessing
unsupervised learning
similarity measure
reinforcement learning
pairwise
prior knowledge
feature set
distance measure
image classification
learning algorithm
semi supervised
recognition algorithm