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Efficient Test Chip Design via Smart Computation.

Chenlei FangQicheng HuangZeye LiuRuizhou DingRonald D. Blanton
Published in: ACM Trans. Design Autom. Electr. Syst. (2023)
Keyphrases
  • chip design
  • cost effective
  • database
  • neural network
  • real time
  • pattern recognition
  • rough sets
  • high speed
  • client server